SA2000 Single tilt
TEM-AFM system

SNanofactory Instruments SA2000 TEM-AFM system allows in-situ AFM specimen characterisation within a side entry single-tilt TEM specimen holder.
The probe scanner is integrated with a patented 3 dimensional approach mechanism providing a very wide range of motion (from picometre to millimeter), to enable the probe to be positioned accurately at the region of interest indicated by TEM imaging. The AFM can be used in contact or non-contact modes.
In addition to acquiring AFM images i.e. surface topography and mechanical properties, the probe may be used for measuring force interactions at specific locations on the specimen. The ability to image the tip as well as the specimen using the TEM means that mechanical properties may be quantified e.g. adhesion, and dynamic processes may be studied.
The FlexForceSensor, a chip based integrated force sensor can measure the probe movements in 3 dimensions.