| Home|
Search
TEM SPECIMEN PREPARATION

 

 

 

 

Products Specifications
601 Ultrasonic A Ultrasonic Disc Cutter is used for obtaining TEM specimen discs from semi-conductor, ceramics, geological or other hard brittle materials.
656 Dimple Grinder Dimple grinding offers a fast and reliable mechanical method of pre-thinning to near electron transparency (in some cases to electron transparency) reducing ion milling times and uneven thinning.
681 High Resolution High Beam Ion Coater A Unique ion beam based sputter coating system producing continuous, ultra thin, amorphous coatings free of thermal artifacts making them ideal for FESEM and TEM applications
682 PECS+ RIBE System Precision Etching Coating System for SEM and LM
683 Met-Etch Preparation of Metallographic Materials

682.40000 Slope Cutter Tool (SC-Tool)

Slope cutting reveals not only the internal microstructure of the cut surface, but also the initial top surface (the third dimension).

691 PIPS A user-friendly precision ion polisher designed to produce high quality, TEM specimens with minimal effort.
950 Advanced Plasma System - SOLARUS Solarus offers faster, more through cleaning of all samples. Capable of safely removing burned on contamination - the system gives a new inspection lifetime to previously contaminated EM samples.

 

 

 

 

 

 

 

 

Manufacturer: Gatan

For more product details, please click here.

 

 

 

 

691 PIPS

 

656 Dimple Grinder

 

SOLARUS

 

 

 

Send mail to info@tsi.com.au with questions or comments about this web site.
Copyright © 2005 Thomson Scientific Instruments Pty Ltd
Last modified: 22 August 2006